Panel LM Unit‐root Tests with Level Shifts

B-Tier
Journal: Oxford Bulletin of Economics and Statistics
Year: 2005
Volume: 67
Issue: 3
Pages: 393-419

Authors (3)

Kyung‐So Im (not in RePEc) Junsoo Lee (University of Alabama-Tuscaloo...) Margie Tieslau (not in RePEc)

Score contribution per author:

0.670 = (α=2.01 / 3 authors) × 1.0x B-tier

α: calibrated so average coauthorship-adjusted count equals average raw count

Abstract

This paper proposes a new panel unit‐root test based on the Lagrangian multiplier (LM) principle. We show that the asymptotic distribution of the new panel LM test is not affected by the presence of structural shifts. This result holds under a mild condition that N/T→k, where k is any finite constant. Our simulation study shows that the panel LM unit‐root test is not only robust to the presence of structural shifts, but is more powerful than the popular Im, Pesaran and Shin (IPS) test. We apply our new test to the purchasing power parity (PPP) hypothesis and find strong evidence for PPP.

Technical Details

RePEc Handle
repec:bla:obuest:v:67:y:2005:i:3:p:393-419
Journal Field
General
Author Count
3
Added to Database
2026-01-25