Localized Knowledge Spillovers and Patent Citations: A Distance-Based Approach

A-Tier
Journal: Review of Economics and Statistics
Year: 2014
Volume: 96
Issue: 5
Pages: 967-985

Authors (4)

Yasusada Murata (Nihon University) Ryo Nakajima (Keio University) Ryosuke Okamoto (not in RePEc) Ryuichi Tamura (not in RePEc)

Score contribution per author:

1.005 = (α=2.01 / 4 authors) × 2.0x A-tier

α: calibrated so average coauthorship-adjusted count equals average raw count

Abstract

We develop a new distance-based test of localized knowledge spillovers that embeds the concept of control patents. Using microgeographic data, we identify localization distance for each technology class while allowing for spillovers across geographic units. We revisit the debate between Thompson and Fox-Kean (2005a, 2005b) and Henderson, Jaffe, and Trajtenberg (2005) on the existence of localized knowledge spillovers and find solid evidence supporting localization even when using finely grained controls. Unless biases induced by imperfect matching between citing and control patents due to unobserved heterogeneity are extremely large, our distance-based test detects localization for the majority of technology classes.

Technical Details

RePEc Handle
repec:tpr:restat:v:96:y:2014:i:5:p:967-985
Journal Field
General
Author Count
4
Added to Database
2026-01-26