Measuring Technological Innovation over the Long Run

A-Tier

Journal: American Economic Review: Insights

Year: 2021

Volume: 3

Issue: 3

Pages: 303-20

Authors (4)

Bryan Kelly (not in RePEc) Dimitris Papanikolaou (Northwestern University) Amit Seru (Stanford University) Matt Taddy (not in RePEc)

Score contribution per author:

1.005 = (α=2.01 / 4 authors) × 2.0x A-tier

α: calibrated so average coauthorship-adjusted count equals average raw count

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Abstract

We use textual analysis of high-dimensional data from patent documents to create new indicators of technological innovation. We identify important patents based on

Measuring Technological Innovation over the Long Run

Authors (4)

Abstract

Technical Details