Modelling exchange rate volatility with random level shifts

C-Tier
Journal: Applied Economics
Year: 2017
Volume: 49
Issue: 26
Pages: 2579-2589

Authors (3)

Ye Li (not in RePEc) Pierre Perron (Boston University) Jiawen Xu (not in RePEc)

Score contribution per author:

0.335 = (α=2.01 / 3 authors) × 0.5x C-tier

α: calibrated so average coauthorship-adjusted count equals average raw count

Abstract

Recent literature has shown that the volatility of exchange rate returns displays long memory features. It has also been shown that if a short memory process is contaminated by level shifts, the estimate of the long memory parameter tends to be upward biased. In this article, we directly estimate a random level shift model to the logarithm of the absolute returns of five exchange rates series, in order to assess whether random level shifts (RLSs) can explain this long memory property. Our results show that there are few level shifts for the five series, but once they are taken into account the long memory property of the series disappears. We also provide out-of-sample forecasting comparisons, which show that, in most cases, the RLS model outperforms popular models in forecasting volatility. We further support our results using a variety of robustness checks.

Technical Details

RePEc Handle
repec:taf:applec:v:49:y:2017:i:26:p:2579-2589
Journal Field
General
Author Count
3
Added to Database
2026-01-29