Examiner citations, applicant citations, and the private value of patents

C-Tier
Journal: Economics Letters
Year: 2009
Volume: 105
Issue: 3
Pages: 287-289

Authors (2)

Hegde, Deepak (not in RePEc) Sampat, Bhaven (Columbia University)

Score contribution per author:

0.503 = (α=2.01 / 2 authors) × 0.5x C-tier

α: calibrated so average coauthorship-adjusted count equals average raw count

View Full Article View on IDEAS/RePEc

Abstract

Examiner citations to a patent are stronger predictors than applicant citations of a widely used measure of patent value: whether a patent has been (or will be) renewed.

Technical Details

RePEc Handle
repec:eee:ecolet:v:105:y:2009:i:3:p:287-289
Journal Field
General
Author Count
2
Added to Database
2026-01-29