Analyzing interest rate risk: Stochastic volatility in the term structure of government bond yields

B-Tier
Journal: Journal of Banking & Finance
Year: 2012
Volume: 36
Issue: 11
Pages: 2988-3007

Authors (2)

Hautsch, Nikolaus (Universität Wien) Ou, Yangguoyi (not in RePEc)

Score contribution per author:

1.005 = (α=2.01 / 2 authors) × 1.0x B-tier

α: calibrated so average coauthorship-adjusted count equals average raw count

Abstract

We propose a Nelson–Siegel type interest rate term structure model where the underlying yield factors follow autoregressive processes with stochastic volatility. The factor volatilities parsimoniously capture risk inherent to the term structure and are associated with the time-varying uncertainty of the yield curve’s level, slope and curvature. Estimating the model based on US government bond yields applying Markov chain Monte Carlo techniques we find that the factor volatilities follow highly persistent processes. We show that yield factors and factor volatilities are closely related to macroeconomic state variables as well as the conditional variances thereof.

Technical Details

RePEc Handle
repec:eee:jbfina:v:36:y:2012:i:11:p:2988-3007
Journal Field
Finance
Author Count
2
Added to Database
2026-01-25