How to measure patent thickets--A novel approach

C-Tier
Journal: Economics Letters
Year: 2011
Volume: 111
Issue: 1
Pages: 6-9

Score contribution per author:

0.335 = (α=2.01 / 3 authors) × 0.5x C-tier

α: calibrated so average coauthorship-adjusted count equals average raw count

Abstract

This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.

Technical Details

RePEc Handle
repec:eee:ecolet:v:111:y:2011:i:1:p:6-9
Journal Field
General
Author Count
3
Added to Database
2026-01-25